000 00927cam a2200289ua 4500
001 36980
005 20171214165133.0
007 ta
008 100809s2008 a g b000 u eng u
020 _a9780470027844
_cUSD 210.00
040 _aMAIN
041 1 _aeng
_hNULL
082 1 4 _a620.11299
_bBRA/M
100 1 _aBrandon, David.
245 1 0 _aMicrostructural characterization of materials /
_cby David Brandon and Wayne D Kaplan.
250 _a2nd ed /
_b.
260 _aEngland :
_bJohn Wiley & Sons ,
_c2008.
300 _axiv,536p. :
_bills.,figs. ;
_c25cm
_e1 CD .
365 _aUSD 210.00
440 0 _aQuantitative software engineering series,
_vNULL
_xNULL;
490 0 _aQuantitative software engineering series,
_vNULL
_xNULL;
504 _aIncludes bibliographical references and index
653 0 _aMATERIALS-MICROSCOPY
653 0 _aMICROSTRUCTURE
700 1 _aKaplan, Wayne D.
942 _cBK
999 _c36658
_d36658