| 000 | 00885cam a2200253ua 4500 | ||
|---|---|---|---|
| 001 | 36908 | ||
| 005 | 20171214165130.0 | ||
| 007 | ta | ||
| 008 | 100804s2007 De a g b000 u eng u | ||
| 020 |
_a9780198570547 _cGBP 75.00 |
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| 040 | _aMAIN | ||
| 041 | 1 |
_aeng _hNULL |
|
| 044 | _aDe | ||
| 082 | 1 | 4 |
_a621.56 _bEKI/E |
| 100 | 1 | _aEkin, Jack W. | |
| 245 | 1 | 0 |
_aExperimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing : cryostat design, material properties, and superconductor critical-current testing / _cby Jack W. Ekin. |
| 250 |
_a / _b. |
||
| 260 |
_aOxford : _bOxford University Press , _c2007. |
||
| 300 |
_axxviii,672p. : _bills.,figures,tables ; _c25cm . |
||
| 365 | _aGBP 75.00 | ||
| 504 | _aIncludes bibliographical references and index | ||
| 653 | 0 | _aELECTRONICS | |
| 942 | _cBK | ||
| 999 |
_c36586 _d36586 |
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