000 00748cam a2200265ua 4500
001 36879
005 20171214165129.0
007 ta
008 100803s2000 a g b000 u eng u
020 _a0748409688
_cGBP41.99
040 _aMAIN
041 1 _aeng
_hNULL
082 1 4 _a502.825
_bGOO/E
100 1 _aGoodhew, Peter J.
245 1 0 _aElectron microscopy and analysis /
_cby Peter J. Goodhew; John Humphreys and Richard Beanland.
250 _a3rd ed /
_b.
260 _aBristol :
_bTaylor and Francis ,
_c2000.
300 _a251p. :
_bfigs, tables ;
_cNULL .
365 _aGBP41.99
504 _aIncludes index
653 0 _aGENEREL SCIENCE
700 1 _aHumphreys, John .
700 1 _aBeanland, Richard .
942 _cBK
999 _c36557
_d36557