| 000 | 00655cam a2200241ua 4500 | ||
|---|---|---|---|
| 001 | 19684 | ||
| 005 | 20171214163946.0 | ||
| 007 | ta | ||
| 008 | 041222s1990 a g b000 u eng u | ||
| 020 |
_a9971510618 _cUSD 11.00 |
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| 040 | _aMAIN | ||
| 041 | 1 |
_aeng _hNULL |
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| 082 | 1 | 4 |
_a621.38152 _bSCH/S |
| 100 | 1 | _aSchroder, Dieter K . | |
| 245 | 1 | 0 |
_aSemiconductor material and device characterization / _cDieter K. Schroder. |
| 260 |
_aNew York : _bJohn Wiley & Sons , _c1990. |
||
| 300 |
_axv,599p. : _bills. ; _c24cm . |
||
| 365 | _aUSD 11.00 | ||
| 504 | _aInclude index | ||
| 653 | 0 | _aSEMICONDUCTORS | |
| 942 | _cBK | ||
| 999 |
_c19364 _d19364 |
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