TY  - BOOK
AU  - Bunke,Horst
AU  - Kandel,Abraham  .
AU  - Last,Mark  .
TI  - Applied pattern recognition / 
SN  - 9783540768302
U1  - 006.4 
PY  - 2008///
CY  - NewYork : 
PB  - Springer-Verlag , 
KW  - COMPUTER METHODS
N1  - Includes index
ER  -