Scanning electron microscopy and x-ray microanalysis / by Grahame Lawes; edited by Arthur M. James.
By: Lawes, Grahame [author].
Contributor(s): James, Arthur M [editor].
Material type:
TextPublisher: New Delhi: John Wiley, 1987Description: 103p.: ill., photographs; 21cm.ISBN: 9788126517305.Subject(s): SEM-InstrumentationDDC classification: 502.825
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Text Book
|
Central Library Reading Room (Library Annex) | 502.825 LAW/S (Browse shelf) | Not For Loan (Restricted Access) | CTDS247 |
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| 500.076 BEN/S Success Master CTET : | 500.5 GRA/S Space science / | 501 ROS/P Philosophy of science : a contemporary introduction / | 502.825 LAW/S Scanning electron microscopy and x-ray microanalysis / | 502.825 LAW/S Scanning electron microscopy and x-ray microanalysis / | 505.98 ROB/R Report of the Canadian Arctic Expedition / | 510 BAT/F Finite element procedures / |
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