Electron microscopy and analysis / by Peter J. Goodhew; John Humphreys and Richard Beanland.
By: Goodhew, Peter J.
Contributor(s): Humphreys, John | Beanland, Richard.
Material type:
TextPublisher: Bristol : Taylor and Francis , 2000Edition: 3rd ed.Description: 251p. : figs, tables ; NULL.ISBN: 0748409688.Subject(s): GENEREL SCIENCEDDC classification: 502.825
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
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Central Library Old Stack Room | 502.825 GOO/E (Browse shelf) | 1 | Available | 84955 |
Includes index
84955 GBP41.99
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