| 000 -LEADER |
| fixed length control field |
00927cam a2200289ua 4500 |
| 005 - DATE & TIME |
| control field |
20171214165133.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
100809s2008 a g b000 u eng u |
| 020 ## - ISBN |
| International Standard Book Number |
9780470027844 |
| Price |
USD 210.00 |
| 040 ## - CATALOGING SOURCE |
| Original cataloging agency |
Central Library |
| 041 1# - Language |
| Language |
|
| -- |
NULL |
| 082 14 - DDC NUMBER |
| Classification number |
620.11299 |
| Book Number |
BRA/M |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
| Personal name |
Brandon, David. |
| 245 10 - TITLE STATEMENT |
| Title |
Microstructural characterization of materials / |
| STMT |
by David Brandon and Wayne D Kaplan. |
| 250 ## - EDITION STATEMENT |
| Edition statement |
2nd ed / |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
| Place of publication, distribution, etc |
England : |
| Name of publisher, distributor, etc |
John Wiley & Sons , |
| Date of publication, distribution, etc |
2008. |
| 300 ## - PHYSICAL DESCRIPTION |
| Pages |
xiv,536p. : |
| Other Details |
ills.,figs. ; |
| Dimension |
25cm |
| 440 0# - Series Statement |
| Series Title |
Quantitative software engineering series, |
| 653 #0 - Subject |
| Subject |
MATERIALS-MICROSCOPY |
| 653 #0 - Subject |
| Subject |
MICROSTRUCTURE |
| 700 1# - Added Entry Personal Name |
| Added Entry Personal Name |
Kaplan, Wayne D. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
| Koha item type |
Books |
| 250 ## - EDITION STATEMENT |
| -- |
. |
| 300 ## - PHYSICAL DESCRIPTION |
| -- |
1 CD . |
| 365 ## - |
| -- |
USD 210.00 |
| 440 0# - Series Statement |
| -- |
NULL |
| -- |
NULL; |
| 490 0# - |
| -- |
Quantitative software engineering series, |
| -- |
NULL |
| -- |
NULL; |
| 504 ## - |
| -- |
Includes bibliographical references and index |
| 541 ## - |
| -- |
85204 |
| -- |
USD 210.00 |